Frederic Houze

Laboratoire Génie Électrique et Électronique de PariS

frederic.houze [at] centralesupelec.fr

En savoir plus sur Frederic Houze

Publications :

  • Article dans une revue - 32 documents
    • François Piquemal, Khaled Kaja, Pascal Chrétien, José Morán-Meza, Frédéric Houzé, Christian Ulysse, Abdelmounaim Harouri. A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements, 2023-11-22. (https://centralesupelec.hal.science/hal-04299424)
    • Guy-Léon Kaza, Frédéric Houzé, Florent Loëte, Philippe Teste. Experimental Study and Phenomenological Laws of Some Nonlinear Behaviours of the Wheel–Rail Contact Associated with the Deshunting Phenomenon, 2023-10-27. (https://centralesupelec.hal.science/hal-04297829)
    • Luna Haydar, Florent Loete, Frédéric Houzé, Tanguy Choupin, Fabien Guiche, Philippe Teste. Enhancing railway network safety by reproducing wheel–rail electrical contact on a laboratory scale, 2023-09. (https://centralesupelec.hal.science/hal-04207532)
    • Romaric Landfried, Mohamed Boukhlifa, Frédéric Houzé, Thierry Leblanc, Philippe Teste. Determination of the Power Balance for Thin Ag-SnO2 Electrodes Submitted to an Electric Arc Based on IR Thermography, 2022-10-05. (https://centralesupelec.hal.science/hal-03800996)
    • Noelle Gogneau, Pascal Chrétien, Tanbir Sodhi, Laurent Couraud, Laetitia Leroy, Laurent Travers, J-C Harmand, François Henri Julien, Maria Tchernycheva, Frédéric Houzé. Electromechanical conversion efficiency of GaN NWs: critical influence of the NW stiffness, the Schottky nano-contact and the surface charge effects, 2022. (https://centralesupelec.hal.science/hal-03719768)
    • Aurélien Fouque, Georges Cailletaud, Alexandre Bonhomme, François Chaudot, Vladimir A. Esin, Frédéric Houzé, Romaric Landfried, Marina Lisnyak, Jean-Luc Ponthenier, Philippe Teste. Estimation of the power flux supplied by an electric arc to Ag-SnO2 electrodes based on cross-section observations of the melted zone, 2020-02. (https://hal.science/hal-02903887)
    • Nicoletta Jegenyes, Martina Morassi, Pascal Chrétien, Laurent Travers, L Lu, F. H. Julien, Maria Tchernycheva, Frédéric Houzé, Noelle Gogneau. High piezoelectric conversion properties of axial InGaN/GaN nanowires, 2018. (https://centralesupelec.hal.science/hal-01798270)
    • Nicolas Jamond, Pascal Chrétien, Lina Gatilova, Elisabeth Galopin, Laurent Travers, Jean-Christophe Harmand, Frank Glas, Frédéric Houzé, Noëlle Gogneau. Energy harvesting efficiency in GaN nanowire-based nanogenerators: the critical influence of the Schottky nanocontact, 2017-03-03. (https://centralesupelec.hal.science/hal-01501840)
    • Brice Gautier, Pascal Chrétien, Khalifa Aguir, Frédéric Houzé, Olivier Schneegans, Johannes Hoffmann, Nicolas Chevalier, Lukasz Borowik, D. Deresmes, Pierre Gournay, Philippe Maillot, François Piquemal. Techniques de mesure de grandeurs électriques adaptées aux nano-circuits, 2016-12-10. (https://centralesupelec.hal.science/hal-01432552)
    • N C Jamond, Pascal Chrétien, Frédéric Houzé, Lu Lu, L Largeau, O Maugain, L Travers, J-C Harmand, F Glas, E Lefeuvre, M Tchernycheva, N C Gogneau. Piezo-generator integrating a vertical array of GaN nanowires, 2016-07-01. (https://hal.science/hal-01390969)
    • Aymeric Vecchiola, Pascal Chrétien, Sophie Delprat, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, Richard Mattana, Sergio Tatay, Bernard Geffroy, Yvan Bonnassieux, Denis Mencaraglia, Frédéric Houzé. Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode, 2016-06-14. (https://cea.hal.science/cea-01331971)
    • Noëlle Gogneau, Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Elie Lefeuvre, M Tchernycheva. From single III-nitride nanowires to piezoelectric generators: New route for powering nomad electronics, 2016-01-15. (https://hal.science/hal-01390955)
    • Alexis Peschot, Maxime Vincent, Christophe Poulain, Denis Mariolle, Frédéric Houzé, Jérôme Delamare. Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches, 2015-12. (https://centralesupelec.hal.science/hal-01235862)
    • Noelle Gogneau, Pascal Chrétien, Elisabeth Galopin, Stephane Guilet, Laurent Travers, Jean-Christophe Harmand, Frédéric Houzé. GaN nanowires for piezoelectric generators, 2014-05. (https://centralesupelec.hal.science/hal-01093504)
    • Noelle Gogneau, Pascal Chrétien, Elisabeth Galopin, Stephane Guilet, Laurent Travers, Jean-Christophe Harmand, Frédéric Houzé. Impact of the GaN nanowire polarity on energy harvesting, 2014-05-01. (https://centralesupelec.hal.science/hal-01096617)
    • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects, 2014-02-02. (https://centralesupelec.hal.science/hal-01093500)
    • Fanny Hauquier, David Alamarguy, Pascal Viel, Sophie Noël, Arianna Filoramo, V. Huc, Frédéric Houzé, Serge Palacin. Conductive-probe AFM characterisation of graphene sheets bonded to gold surfaces, 2012. (https://cea.hal.science/cea-00960581)
    • A. Mdarhri, D. Alamarguy, F. Houzé, S. Noël, S. Volz, H. Li, Jinbo Bai. Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotubes materials, 2011-09-26. (https://hal.science/hal-00626568)
    • Maguy Dominiczak, Larissa Otubo, David Alamarguy, Frédéric Houzé, Sebastian Volz, Sophie Noël, Jinbo Bai. Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy, 2011-04-07. (https://shs.hal.science/halshs-00587572)
    • M. Vincent, S. W. Rowe, C. Poulain, L. Chiesi, Frédéric Houzé, J. Delamare. Field emission and material transfer in microswitches electrical contacts, 2010. (https://centralesupelec.hal.science/hal-00554768)
    • Sophie Noël, David Alamarguy, Frédéric Houzé, Alessandro Benedetto, Pascal Viel, Serge Palacin, Nicolas Izard, Pascale Chenevier. Nanocomposite thin films for surface protection in electrical contact applications, 2009-07-22. (https://cea.hal.science/cea-01022834)
    • E. Moyen, M. Macé, G. Agnus, A. Fleurence, T. Maroutian, F. Houzé, A. Stupakiewics, L. Masson, B. Bartenlian, W. Wulfhekel, P. Beauvillain, M. Hanbücken. Metal-rich Au-silicide nanoparticles for use in nanotechnology, 2009. (https://hal.science/hal-00413540)
    • Erwan Tranvouez, E. Boer-Duchemin, A.J. Mayne, T. Vanderbruggen, M. Scheele, R. Cartwright, G. Comtet, Guillaume Dujardin, Olivier Schneegans, Pascal Chrétien, Frédéric Houzé. Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy, 2009. (https://centralesupelec.hal.science/hal-00444497)
    • David Alamarguy, Alessandro Benedetto, Mirela Balog, Sophie Noël, Pascal Viel, Franck Le Derf, Frédéric Houzé, Marc Salle, Serge Palacin. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts, 2008-02-06. (https://cea.hal.science/cea-01056595)
    • Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy, 2007. (https://centralesupelec.hal.science/hal-00320357)
    • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy, 2007. (https://centralesupelec.hal.science/hal-00320360)
    • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy, 2006. (https://centralesupelec.hal.science/hal-00320288)
    • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, D. Tromson. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy, 2006. (https://centralesupelec.hal.science/hal-00320285)
    • Frédéric Houzé, Pascal Chrétien, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode, 2005. (https://centralesupelec.hal.science/hal-00320223)
    • Olivier Schneegans, Lionel Boyer, Frédéric Houzé, René Meyer, Pascal Chrétien. “ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy, 2002. (https://hal.science/hal-00098202)
    • C. Guedj, J. Boulmer, D. Bouchier, C. Clerc, G. Calvarin, C. Godet, Pere Roca I Cabarrocas, F. Houze, D. Mencaraglia. Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy, 1996. (https://hal.in2p3.fr/in2p3-00000499)
    • Pascal Newton, Frédéric Houzé, Sophie Noël, Lionel Boyer, Pascal Viel, Gérard Lécayon. Élaboration et caractérisation chimique, topographique, tribologique et électrique de films de polyacrylonitrile post-traités en vue d'applications en connectique, 1995. (https://hal.science/jpa-00249338)
  • Communication dans un congrès - 72 documents
    • Luna Haydar, Florent Loete, Frédéric Houzé, Philippe Teste, Tanguy Choupin, Fabien Guiche. A wheel-rail electrical contact experiment at the laboratory scale, 2023-11-22. (https://centralesupelec.hal.science/hal-04214192)
    • François Piquemal, Khaled Kaja, Pascal Chrétien, José A. Morán-Meza, Frédéric Houzé, Christian Ulysse, Abdelmounaim Harouri. Calibrating Resistance Measurements in Conductive Probe Atomic Force Microscopy: development of the first universal standard sample, 2023-10-10. (https://centralesupelec.hal.science/hal-04230175)
    • Corentin Ferreira, Aurore Brézard-Oudot, Manon Isard, Sophie Noël, Frédéric Houzé, Philippe Teste. Electrical and tribological behaviour of gold/gold sliding contacts of the wire/ring type for slip ring applications, 2023-10-04. (https://centralesupelec.hal.science/hal-04207904)
    • Corentin Ferreira, Aurore Brézard-Oudot, Manon Isard, Sophie Noël, Frédéric Houzé, Philippe Teste. Comportement électrique et tribologique des contacts glissants or/or d’un collecteur tournant type cil/bague, 2023-05-31. (https://centralesupelec.hal.science/hal-04128765)
    • Julien Acquadro, Sophie Noël, Pascal Chrétien, Frédéric Houzé, Philippe Teste, Clément Genet, Hiba Hazougaghe, Florence Ansart, Marie Gressier, Marie-Joëlle Menu, Robin Montpellaz, Olivier Gavard, Romain Leroy, Gérald Trédan, Simon Demarthon, Thomas Pichot, Frédéric Raoul, M. Ladiré. Innovative sol-gel coatings for corrosion protection of connector housings, 2022-10-23. (https://centralesupelec.hal.science/hal-03801186)
    • Julien Acquadro, Sophie Noël, Pascal Chrétien, Frédéric Houzé, Philippe Testé, Clément Genet, Hiba Hazougaghe, Florence Ansart, Marie Gressier, Marie-Joëlle Menu. Characterization of innovative sol-gel coatings by electrical and mechanical measurements by atomic force microscopy techniques, 2022-07-24. (https://centralesupelec.hal.science/hal-03843900)
    • Tanbir Sodhi, Pascal Chrétien, Laurent Travers, Frédéric Houzé, Noëlle Gogneau. Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances, 2021-07-02. (https://centralesupelec.hal.science/hal-03844452)
    • Tanbir Sodhi, Pascal Chrétien, Martina Morassi, Laurent Travers, Lu Lu, Jean-Christophe Harmand, François H Julien, Elie Lefeuvre, M Tchernycheva, Frédéric Houzé, Noëlle Gogneau. Piezoelectric properties of GaN Nanowires: Effect of their conductivity, 2019-11-13. (https://centralesupelec.hal.science/hal-02337953)
    • Noëlle Gogneau, Pascal Chrétien, Martina Morassi, Tanbir Sodhi, Laurent Travers, Ludovic Largeau, Jean-Christophe Harmand, François H Julien, Elie Lefeuvre, M Tchernycheva, Frédéric Houzé. Piezoelectric properties of axial InGaN/GaN Nanowires, 2019-11-13. (https://centralesupelec.hal.science/hal-02337971)
    • Junkang Wang, Lu Lu, Tanbir Sodhi, Pascal Chrétien, Frédéric Houzé, François H Julien, Noelle Gogneau, Maria Tchernycheva. Piezoelectric energy nanoharvester based on vertically-aligned GaN nanowires, 2019-09-23. (https://centralesupelec.hal.science/hal-02337899)
    • Nataliya Kalashnyk, Sophie Noël, Pascal Chrétien, Aurore Brézard-Oudot, Thierry Leblanc, Frédéric Houzé, Fanny Hauquier, Vincent Derycke, Thomas Berthelot, Didier Rousseau. Printed copper connections on flexible substrates, 2019-09-15. (https://centralesupelec.hal.science/hal-02154088)
    • Aurélien Fouque, Georges Cailletaud, Vladimir A. Esin, Romaric Landfried, Philippe Testé, Frédéric Houzé, Alexandre Bonhomme, Jean-Luc Ponthenier, François Chaudot, Marina Lisnyak. Observation of metallurgical changes induced by an electric arc to Ag-SnO2-CuO electrodes, 2019-09-15. (https://centralesupelec.hal.science/hal-02155532)
    • Noelle Gogneau, Pascal Chrétien, Nicolas Jamond, L Lu, Nicoletta Jegenyes, Martina Morassi, Tanbir Sodhi, Laurent Travers, Jean-Christophe Harmand, François H Julien, Elie Lefeuvre, Frédéric Houzé, Maria Tchernycheva. GaN nanowires based piezoelectric generators, 2019-07-07. (https://centralesupelec.hal.science/hal-02154041)
    • Tanbir Sodhi, Pascal Chrétien, Nicolas Jamond, Noëlle Gogneau, Frédéric Houzé. Apport de l'AFM à pointe conductrice pour la caractérisation des performances de piézo-génération de nanofils GaN, 2019-03-19. (https://centralesupelec.hal.science/hal-02152858)
    • Aurélien Fouque, Alexandre Bonhomme, Georges Cailletaud, François Chaudot, Vladimir A. Esin, Frédéric Houzé, Romaric Landfried, Marina Lisnyak, Jean-Luc Ponthenier, Philippe Testé. Proposition d’une méthode visant à estimer l’énergie apportée par un arc à une anode en Ag-SnO2, 2019-03-18. (https://centralesupelec.hal.science/hal-02152896)
    • Aurélien Fouque, Georges Cailletaud, Vladimir A. Esin, Romaric Landfried, Philippe Testé, Frédéric Houzé, Alexandre Bonhomme, Jean-Luc Ponthenier, François Chaudot. Interaction between electric arc and Ag-SnO2 electrodes, 2018-07-02. (https://centralesupelec.hal.science/hal-01927303)
    • Noëlle Gogneau, Pascal Chrétien, Martina Morassi, Nicoletta Jegenyes, Laetitia Leroy, Laurent Travers, Maria Tchernycheva, Frédéric Houzé. Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode, 2018-05-08. (https://centralesupelec.hal.science/hal-01798287)
    • Nicolas Jamond, Pascal Chrétien, Lina Gatilova, Elizabeth Galopin, Laurent Travers, Jean-Christophe Harmand, Frank Glas, Frédéric Houzé, Noëlle Gogneau. Energy harvesting efficiency in GaN nanowires based nanogenerators: the critical influence of the Schottky nanocontact, 2018-05-08. (https://centralesupelec.hal.science/hal-01798304)
    • Romaric Landfried, Frédéric Houzé, Thierry Leblanc, Philippe Philippe.Teste@supelec.Fr Teste. Power flux brought by an electric arc on AgSnO2 electrodes, 2017-09-10. (https://centralesupelec.hal.science/hal-01591486)
    • L. Lu, N. Jamond, E. Lefeuvre, Pascal Chrétien, F. Houzé, L. Travers, J. C. Harmand, F. Glas, N. Gogneau, F. H. Julien, M. Tchernycheva. High Sensitivity Piezogenerator Based on GaN Nanowires, 2017-09-03. (https://centralesupelec.hal.science/hal-01591362)
    • Nicoletta Jegenyes, Martina Morassi, Pascal Chrétien, Laurent Travers, L Lu, Jean-Christophe Harmand, Frédéric Houzé, Maria Tchernycheva, Noelle Gogneau. Piezoelectric conversion with InGaN/GaN nanowire heterostructures, 2017-07-24. (https://centralesupelec.hal.science/hal-01591417)
    • Florent Loete, Guy-Leon Kaza, Philippe Testé, Romaric Landfried, Frédéric Houzé, Hugues Chollet, Xavier Lorang. Étude expérimentale du contact électrique roue/rail, 2017-03-20. (https://centralesupelec.hal.science/hal-01481567)
    • Philippe Testé, Romaric Landfried, Frédéric Houzé, Aurélien Fouque, Georges Cailletaud, Vladimir A. Esin, Alexandre Bonhomme, François Chaudot, Jean-Luc Ponthenier. Détermination des caractéristiques du flux de puissance apporté à des électrodes en AgSnO2 par un arc non stationnaire dans l’air, 2017-03-20. (https://centralesupelec.hal.science/hal-01481584)
    • L. Lu, N. Jamond, Pascal Chrétien, F. Houzé, L. Travers, J. C. Harmand, F. Glas, F. H. Julien, E. Lefeuvre, N. Gogneau, Maria Tchernycheva. Nitride Nanowires: From Rigid to Flexible Piezo-generators, 2016-12-06. (https://hal.science/hal-01653358)
    • Pascal Chrétien, Sophie Noël, Alexandre Jaffré, Frédéric Houzé, David Brunel, Joanna Njeim. Electrical and structural mapping of friction induced defects in graphene layers, 2016-10-09. (https://centralesupelec.hal.science/hal-01332589)
    • Noëlle Gogneau, Nicolas Jamond, Laurent Travers, Jean-Christophe Harmand, Frank Glas, L. Lu, Elie Lefeuvre, Maria Tchernycheva, Pascal Chrétien, Frédéric Houzé. Piezo-Generator Integrating Vertical Array of GaN Nanowires: A new alternative energy source for nomad electronics, 2016-10-04. (https://centralesupelec.hal.science/hal-01631168)
    • Kevin Dalla-Francesca, Sophie Noël, David Brunel, Frédéric Houzé, Pascal Chrétien, Alexandre Jaffré, David Alamarguy. Soft ultrasonic exfoliation of multilayer graphene for an application to electrical contacts, 2016-06-06. (https://centralesupelec.hal.science/hal-01332540)
    • Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, Sergio Tatay, Frédéric Houzé. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode, 2016-06-01. (https://centralesupelec.hal.science/hal-01320255)
    • Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, Sergio Tatay, Frédéric Houzé. Imagerie de résistance électrique locale sur matériaux fragiles par microscopie à force atomique à pointe conductrice en mode contact intermittent, 2016-03-21. (https://centralesupelec.hal.science/hal-01317747)
    • Noelle Gogneau, Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Elisabeth Galopin, Stephane Guilet, Laurent Travers, Jean-Christophe Hermand. GaN nanowires for piezoelectric energy harvesting : Towards wireless sensors, 2016-03-08. (https://centralesupelec.hal.science/hal-01315747)
    • Vladislav Yastrebov, Georges Cailletaud, Sophie Noël, Frederick Sorel Mballa-Mballa Mballa Mballa, Henry Proudhon, Frédéric Houzé, Philippe Testé. Three-level multi-scale modeling of electrical contacts - sensitivity study and experimental validation, 2015-10-11. (https://centralesupelec.hal.science/hal-01218663)
    • Nicolas Jamond, Laurent Travers, Franck Glas, Noelle Gogneau, Pascal Chrétien, Frédéric Houzé, Maria Tchernycheva, Elie Lefeuvre. GaN nanowires based piezogenerator - Investigation of the GaN nanowires potentiality for the development of piezogenerators, 2015-05-20. (https://centralesupelec.hal.science/hal-01258276)
    • Kevin Dalla-Francesca, Sophie Noël, Aymeric Vecchiola, Frédéric Houzé, Pascal Chrétien, David Alamarguy, Alexandre Jaffré. Electrical characterization of graphene-like films at microscopic and macroscopic scale, 2014-10-12. (https://centralesupelec.hal.science/hal-01099230)
    • Vladislav Yastrebov, G. Anciaux, Frederick Mballa Mballa, Georges Cailletaud, Jean-François Molinari, Henry Proudhon, Sophie Noël, Frédéric Houzé, Philippe Testé. Multi-physical contact between elastic and elasto-plastic solids with fractal surfaces, 2014-10-06. (https://centralesupelec.hal.science/hal-01099232)
    • Frederick Mballa Mballa, Vladislav Yastrebov, Frédéric Houzé, Georges Cailletaud, Sophie Noël, Henry Proudhon, Philippe Testé. Multiscale modeling of electrical contacts, 2014-10-06. (https://centralesupelec.hal.science/hal-01099234)
    • N. Jamond, Pascal Chrétien, E. Galopin, Laurent Travers, J.C. Harmand, Frédéric Houzé, Noelle Gogneau. Piezoelectric Potential of GaN Nanowires: Towards Efficient Output Piezo-generators, 2014-04-07. (https://centralesupelec.hal.science/hal-01099228)
    • Aymeric Vecchiola, Frédéric Houzé, Pascal Chrétien, Olivier Schneegans. Avancées récentes sur les mesures de résistance électrique locale par AFM à pointe conductrice en contact intermittent, 2014-03-17. (https://centralesupelec.hal.science/hal-01093608)
    • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent, 2013-11. (https://centralesupelec.hal.science/hal-00927019)
    • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, Stéphane Fusil, Richard Mattana, Pierre Seneor. Mesures électriques locales par AFM en mode intermittent, 2013-11. (https://centralesupelec.hal.science/hal-00927020)
    • Aymeric Vecchiola, Olivier Schneegans, Pascal Chrétien, Frédéric Houzé. Développement d'une imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent, 2013-03-25. (https://centralesupelec.hal.science/hal-00927018)
    • Pascal Chrétien, Aymeric Vecchiola, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, Stéphane Fusil, Richard Mattana, Pierre Seneor. Mesures électriques locales par AFM en mode intermittent, 2012-11. (https://centralesupelec.hal.science/hal-00778776)
    • Hugues Chollet, Frédéric Houzé, Philippe Testé, Florent Loete, Xavier Lorang, Sébastien Debucquoi. Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts, 2012-08. (https://centralesupelec.hal.science/hal-00778780)
    • Frédéric Houzé, Philippe Testé, Florent Loete, Richard Andlauer, Hugues Chollet, Xavier Lorang, Sébastien Debucquoi, Francis Lerdu, Marc Antoni. Electrical behaviour of the wheel-rail contact, 2012-05. (https://centralesupelec.hal.science/hal-00778767)
    • Fanny Hauquier, David Alamarguy, Laurent Baraton, P Viel, Sophie Noël, A Filoramo, V Huc, Frédéric Houzé, Serge Palacin. Conductive-probe AFM characterization of graphene sheets chemically grafted on gold surfaces, 2011-05. (https://centralesupelec.hal.science/hal-00710616)
    • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Optimisation de la mesure de capacité électrique locale absolue par AFM à sonde conductrice, 2011-03-28. (https://centralesupelec.hal.science/hal-00710620)
    • M Vincent, S. W. Row, C Poulain, L Chiesi, Frédéric Houzé, J Delamarre. Apport du microscope à force atomique pour l\'étude de certains phénomènes relatifs aux micro-contacts électriques, 2011-03. (https://centralesupelec.hal.science/hal-00710617)
    • Sophie Noël, David Alamarguy, Fanny Hauquier, Frédéric Houzé, P. Viel, Serge Palacin. Electrical conduction properties of molecular ultra-thin layers in a nanocontact, 2010-10. (https://centralesupelec.hal.science/hal-00554771)
    • J. Bai, Frédéric Houzé, Ahmed Mdarhri, David Alamarguy, Sophie Noël, S. Volz. Étude multi-échelle des mécanismes de transport dans des nanostructures à base de nanotubes de carbone, 2009-10. (https://centralesupelec.hal.science/hal-00445401)
    • M. Vincent, L. Chiesi, P. Rousset, C. Lapierre, C. Poulain, L. Carbone, Frédéric Houzé, J. Delamarre. An original apparatus for endurance testing of MEMS electrical contact materials, 2009-09. (https://centralesupelec.hal.science/hal-00445399)
    • Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Avancées successives sur la mesure de résistance électrique locale par AFM à pointe conductrice, 2009-03. (https://centralesupelec.hal.science/hal-00445404)
    • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Mesures de capacité absolue par AFM à pointe conductrice, 2009-03. (https://centralesupelec.hal.science/hal-00445402)
    • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Mesures de capacité absolue par AFM à pointe conductrice: problématique et avancées récentes, 2008-12. (https://centralesupelec.hal.science/hal-00353331)
    • M. Vincent, L. Chiesi, J.-C. Fourrier, Aline Garnier, B. Grappe, C. Lapiere, C. Coutier, A. Sampiero, S. Paineau, Frédéric Houzé, Sophie Noël. Electrical contact reliability in a magnetic MEMS switch, 2008-10. (https://centralesupelec.hal.science/hal-00351428)
    • Patrice Retho, Alexis Poizat, Richard Andlauer, J.-S. Lefrileux, Frédéric Houzé, René Meyer. Resistance and contact force measurements on a miniature multi-contact stacking connector, 2008-10. (https://centralesupelec.hal.science/hal-00351432)
    • Alexis Poizat, Michèle Nsoumbi, Philippe Testé, Frédéric Houzé, Richard Andlauer, Thierry Leblanc. Contribution to the observation of the effective electrical contact area with the help of a space time resolved thermal camera, 2008-06. (https://centralesupelec.hal.science/hal-00351387)
    • Pascal Chrétien, Ivan Estevez, Olivier Schneegans, Frédéric Houzé. The Resiscope module for DC conductivity measurements by AFM : an overview of performances and some various applications, 2008-05. (https://centralesupelec.hal.science/hal-00351356)
    • Sophie Noël, David Alamarguy, Frédéric Houzé, Alessandro Benedetto, P. Viel, Serge Palacin, N. Izard, P. Chenevier. Nanocomposite thin films for surface protection in electrical contact applications, 2007. (https://centralesupelec.hal.science/hal-00320371)
    • David Alamarguy, Alessandro Benedetto, M. Balog, Sophie Noël, P. Viel, F. Le Derf, Frédéric Houzé, M. Sallé, Serge Palacin. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts, 2007. (https://centralesupelec.hal.science/hal-00320386)
    • Alessandro Benedetto, David Alamarguy, N. Izard, P. Chenevier, P. Viel, Frédéric Houzé, Sophie Noël, Serge Palacin. Films minces nanocomposites à base de nanotubes de carbone et polymères fluorés pour la lubrification des contacts électriques, 2006. (https://centralesupelec.hal.science/hal-00320332)
    • Olivier Schneegans, Frédéric Houzé, Pascal Chrétien. Mesures de capacités plan/plan dans la gamme 1pF-1fF : mise en évidence des effets de bord, proposition d'un modèle et confrontation à des simulations numériques, 2006. (https://centralesupelec.hal.science/hal-00320315)
    • José Alvarez, Frédéric Houzé, Pascal Chrétien, Jean-Paul Kleider, C. Bazin, M. Liao, Y. Koide. Local photoconductivity on Schottky diamond photodetectors measured by conducting probe atomic force microscopy, 2006. (https://centralesupelec.hal.science/hal-00320301)
    • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured byconducting probe atomic force microscopy, 2006. (https://centralesupelec.hal.science/hal-00321918)
    • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, Pascal Chrétien, M. Liao, Y. Koide. Mesures locales de photoconductivité par AFM à pointe conductrice sur des dispositifs métal-semiconducteur-métal à base de diamant, 2006. (https://centralesupelec.hal.science/hal-00320320)
    • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy, 2006. (https://centralesupelec.hal.science/hal-00320298)
    • Alessandro Benedetto, P. Viel, Sophie Noël, Frédéric Houzé, Serge Palacin. Carbon nanotubes/fluorinated polymers nanocomposite thin films for electrical contacts lubrication, 2006. (https://centralesupelec.hal.science/hal-00320312)
    • J.C. Villégier, Annick Dégardin, B. Guillet, Frédéric Houzé, Alain Kreisler, M. Chaubet. Fabrication of high-Tc superconducting hot electron bolometers for terahertz mixer applications, 2005. (https://centralesupelec.hal.science/hal-00320229)
    • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, D. Tromson. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy, 2005. (https://centralesupelec.hal.science/hal-00321705)
    • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, D. Tromson. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy, 2005. (https://centralesupelec.hal.science/hal-00320238)
    • Frédéric Houzé, D. Mariolle, F. Bertin, Pascal Chrétien, Olivier Schneegans. Caractérisation de profils de dopage par imagerie de résistance locale à faible force, 2005. (https://centralesupelec.hal.science/hal-00320231)
    • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode, 2005. (https://centralesupelec.hal.science/hal-00320256)
    • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, D. Tromson. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy, 2005. (https://centralesupelec.hal.science/hal-00321568)
    • Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, René Meyer, Lionel Boyer. Simultaneous height, resistance and capacitance cartography of a SRAM test sample by conducting probe AFM, 2004. (https://centralesupelec.hal.science/hal-00320180)
  • POSTER - 9 documents
    • Corentin Ferreira, Aurore Brézard-Oudot, Manon Isard, Sophie Noël, Frédéric Houzé, Philippe Teste. A new set-up for the investigation of electrical and tribological properties of wire/ring sliding contacts, 2023-04-17. (https://hal.science/hal-04121443)
    • François Piquemal, Johannes Hoffmann, Khaled Kaja, Brice Gautier, Andreas Hertwig, Norbert Fabricius, Petr Klapetek, Aslan Hüsnü, Bernd Kaestner, Aisha Ozbay, Lukasz Borowik, Frédéric Houzé, Georg Gramse, Kamel Haddadi, Philipp Dobson. ELENA : a European project for electrical nanoscale metrology in industry, 2023-04-03. (https://centralesupelec.hal.science/hal-04128717)
    • Aymeric Vecchiola, Pascal Chrétien, Noelle Gogneau, Karim Bouzehouane, Olivier Schneegans, Frédéric Houzé. Formation de matière sur des surfaces imagées par AFM en mode intermittent : un artefact inattendu, 2016-03-21. (https://centralesupelec.hal.science/hal-01317764)
    • Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Laurent Travers, Franck Glas, Elie Lefeuvre, Maria Tchernycheva, Noelle Gogneau. GaN nanowires based piezogenerator, 2015-10-26. (https://centralesupelec.hal.science/hal-01258198)
    • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, Stéphane Fusil, Richard Mattana, Pierre Seneor. Mesures électriques locales par AFM en mode intermittent, 2014-11-12. (https://hal.science/hal-01338861)
    • Alexis Peschot, Maxime Vincent, Christophe Poulain, Denis Mariolle, Frédéric Houzé, Jérôme Delamare. Conducting probe atomic force microscope as a relevant tool for studying some phenomena in MEMS switches, 2014-11-06. (https://centralesupelec.hal.science/hal-01099238)
    • Nicolas Jamond, Pascal Chrétien, L Largeau, Olivia Mauguin, Elisabeth Galopin, Laurent Travers, Jean-Christophe Harmand, Frédéric Houzé, Noelle Gogneau. Effect of the AlN interfacial layer on the piezoelectric properties of GaN nanowires, 2014-10-27. (https://hal.science/hal-01338879)
    • Kevin Dalla-Francesca, Sophie Noël, Frédéric Houzé, David Alamarguy, Alexandre Jaffré. Morphological and electrical characterizations of graphene exfoliated by liquid way, 2014-05-06. (https://centralesupelec.hal.science/hal-01099345)
    • Kevin Dalla-Francesca, Sophie Noël, Frédéric Houzé, David Alamarguy, Alexandre Jaffré. Caractérisations morphologique et électrique de graphène déposé par voie liquide, 2014-03-17. (https://centralesupelec.hal.science/hal-01093610)
  • PATENT - 2 documents
  • Chapitre d'ouvrage - 1 document
  • Autre publication - 3 documents
    • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans. Transfert de savoir-faire pour la mise en forme, la fabrication et la mise sur le marché du Résiscope, 2007. (https://centralesupelec.hal.science/hal-00320405)
    • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Améliorations apportées au dispositif de mesure rapide de courant et de résistance électrique pouvant varier sur plusieurs décades, 2006. (https://centralesupelec.hal.science/hal-00320345)
    • René Meyer, Frédéric Houzé, Philippe Testé. Réduction de l'inductance propre d'une boucle conductrice, application à la réalisation de contacts pour interposeurs, 2005. (https://centralesupelec.hal.science/hal-00320266)